President’s Message

Highlighting Select Papers from  AUTOTESTCON 2016 and Beyond

Welcome to IEEE AUTOTESTCON 2017

Ruth A. Dyer, IEEE Instrumentation and Measurement Society President

On behalf of the IEEE Instrumentation and Measurement Society (IMS), I want to welcome you to IEEE AUTOTESTCON 2017 at the Renaissance Schaumburg Convention Center Hotel in Schaumburg, Illinois! This conference provides outstanding opportunities to learn about the newest automated testing technologies being developed and implemented, as well as to meet with colleagues and make new acquaintances. We know you will enjoy your experience as one of the many attendees at this conference. 

The long-lasting, collaborative sponsorship of AUTOTESTCON by the IMS and the IEEE Aerospace and Electronic Systems Society (AESS) has been highly successful, and it has facilitated the exchange of innovative ideas and information among our two engineering professional societies, government entities, and industry for more than 50 years. The student-travel awards and best-paper awards provided by the IMS assist our student members financially in being able to attend and recognize their valuable contributions to emerging technologies. 

Attending this conference is also a great way for students to meet, and establish important relationships early in their careers with professionals in the military and the aerospace industry.
Another one of the highlights of AUTOTESTCON is the large number of exhibitors who attend, showcase their products and services, and demonstrate state-of-the-art instruments and the impressive measurements of which these instruments are capable. Seeing the pioneering ideas developed by researchers come to life in the form of these novel instruments is truly exciting!

As has been our custom over the last few years, we highlight papers presented at the 2016 AUTOTESTCON in the August 2017 issue of IEEE Instrumentation and Measurement Magazine. We hope you will find the information presented in the papers included in this issue to be useful to you, and we hope you will enjoy IEEE AUTOTESTCON 2017!  

-Ruth


Teresa Pace, IEEE Aerospace and Electronic Systems Society President

As President of IEEE Aerospace and Electronic System Society, I am pleased to be able to once again join the IEEE Instrumentation and Measurement Society in welcoming you to this year's IEEE AUTOTESTCON in Schaumburg, Illinois. This is an incredibly exciting conference that brings together students, researchers, academics, government, and industry participants from all over the world in a beautiful setting to discuss the most advanced automated test technologies available. Covering Performance Based Logistics, Health Monitoring and Diagnostics, embedded Instrumentation, Support Economics, and Test & Support Management, the conference provides an excellent venue for dialogue and information exchange on topics that are of significant interest to the Aerospace and Electronic Systems community. System readiness and automatic test are critical components in providing government and military users with equipment that is reliable, dependable, and effective. In our rapidly evolving and challenging world climate, this is more important now than ever. This conference is precisely the place to be able to discover, share, and discuss ideas, needs, and recent developments to stay up to date and be ready to rapidly respond as soon as the need may arise. 

The IEEE AES Society is proud to be a co-sponsor of this conference along with the IEEE I&M Society, with whom we have had the honor of collaborating for many years. 

Very best regards,
Teresa 

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