New Products

Please send all “New Products” information to:
Robert M. Goldberg
1360 Clifton Ave.
PMB 336
Clifton, NJ 07012 USA

 

E-mail: r.goldberg@ieee.org

 

 

Vector Network Analyzer Supports 43.5 GHz Operation

Anritsu has introduced a 43.5 GHz frequency option for its 2- and 4-port ShockLine™ MS46122B, MS46322B, MS46522B, and MS46524B vector network analyzers (VNAs) with guaranteed specifications using Anritsu’s Extended-K™ type connectors and components. According to Anritsu, the ShockLine family becomes the first VNA to support specified 43.5 GHz functionality in a K-connector environment, creating distinct cost-of-test and time-to-market advantages in high-frequency applications, including 5G, satellite, and signal integrity.

With the introduction of the Extended-K calibration kits and accessories, the option eliminates the need to use inconvenient adaptors or completely change the connector type. It provides design and manufacturing engineers with an efficient solution that adds the critical 3.5 GHz to a test environment for verification of products used in emerging applications.

For 4-port test environments, there is the ShockLine MS46524B series. The VNAs deliver economical and performance efficiencies in a multiport VNA to lower the cost-of-test and speed time-to-market.

To learn more, visit www.anritsu.com.

 

Core Test Systems for Microwave and RF Applications

In-Phase Technologies has announced four new Core Test Sets. Analog and digital test systems are already embracing the new concept of Core Test Sets. Core Test Sets save money through ease of configurability. In-Phase says it is time for the microwave and RF Automated Test Equipment (ATE) community to do the same.

With In-Phase Technologies’ pre-configured Core Test Sets, test engineers can cut test set development time in half. They also save on development time, manufacturing, and documentation costs. In-Phase assures total system signal integrity among all pre-configured building blocks.

New Core Test Set Models:

  • Analog/Digital Core Test Set (#1342649) for avionics products, power supplies, LCR measurements, low frequency boards (<1 GHz), electronic loads, etc.

  • Full Transceiver Core Test Set (#1342650) for digital or analog radios, radars, altimeters, frequency translators, and components

  • Amplifier Core Test Set (#1342651) for high power amplifiers, low noise amplifiers, medium power amplifiers, frequency translators, and components

  • Transmitter Core Test Set (#1342652) for all types of transmitters from analog to digital modulation

  • Receiver Core Test Set (#1342653) for all types of receivers, including analog and digital modulation

An In-Phase Technologies Core Test Set provides a pre-engineered, integrated hardware framework to build a unique test set, including:

  • A set of COTS test equipment in an enclosure, with power and wire management systems, proper air flow, and coiling

  • A high-density interface with pre-defined signal points

  • LabVIEW instrument drivers designed for hardware abstraction

Find more information at www.in-phasetech.com.

 

Semiconductor Test System

The TS-960e PXI Express Semiconductor Test System from Marvin Test Solutions is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench-top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications. The test system incorporates a high power (60 watts per slot), 21-slot, PXIe chassis and a custom-designed, performance test interface that supports the use of PCB DUT (Device Under Test) boards—a proven and high-performance method for interfacing to the device under test. The configuration of the receiver can support up to 512 digital channels, as well as a range of analog, device power supply (DPS) and RF resources.

The basic system includes 64, digital I/O channels; 64 static digital I/O channels; a programmable DPS; a system self-test and fixture; software for digital waveform editing / display; ICEasy—device test development tools; and Marvin Test Solutions' ATEasy software which provides an integrated and complete test executive and test development environment, allowing users to quickly develop and easily maintain test applications.

For RF test applications, the TS-960e is available with Keysight Technologies' comprehensive portfolio of PXIe RF instrumentation which can address a wide range of RF products and technologies, including WLAN, Bluetooth, Cellular, EW, and RF transceivers. Available instrumentation options include Keysight Technologies’ vector transceivers, vector signal analyzers and generators, and vector network analyzers, offering wafer and packaged RF test capabilities from 9 KHz to 27 GHz.

The test system is supplied with ATEasy and all instrument drivers, virtual instrument panels, and a system self-test as well as ICEasy test software tools which facilitates device test development and characterization. 

Find more information at www.marvintest.com.

 

Phase Noise Test Set (PNTS)

Keysight Technologies has introduced a new phase noise measurement system for "power users," which enables them to optimize and prove performance of new designs, meet operational requirements, as well as remain on schedule and on budget.

Phase noise is an unwanted phase modulation noise that emerges in nearly all radio frequency and microwave devices, including oscillators, mixers, dividers, multipliers and amplifiers. Power users, including professionals responsible for developing high-performance aerospace and defense applications as well as cutting-edge device characterization for 5G and other wireless communication systems, need to validate the phase noise performance of their designs.

Keysight's new N5511A Phase Noise Test System (PNTS) models are available in three frequency ranges—from 50 kHz and going up to 3, 26.5, or 40 GHz with offsets from .01 Hz to 160 MHz internally. It can be configured for either single- or dual-channel operation and offers the following key technology features:

With a flexible architecture for easy integration of external reference sources, users can select from a variety of commercially available low-noise sources.  Cross spectral averaging (cross-correlation) to measure noise approaches the limits of physics, down to the kT (–177 dBm/Hz) thermal noise floor, by removing uncorrelated noise between two channels and enabling users to see the real performance of their device under test.

The flexible and scalable architecture of Keysight's N5511A PNTS enables power users to:

  • Confidently and quickly solve specific challenges in phase noise by removing uncorrelated reference noise, system noise and any additional uncorrelated noise from signal conditioning devices such as attenuators and amplifiers.

  • Generate faster measurements using hardware acceleration with fast Fourier transform (FFT) and cross-correlation in a Field Programmable Gate Array (FPGA), rather than software on a CPU.

  • Simplify set-up of residual measurements using the phase noise measurement interface (PNMI) accessory.

  • Stay ahead of the leading edge in metrology and calibration and adapt to future needs by upgrading from single channel to dual channel (for cross-correlation) and integrating other PXI modules for new functionality.

Consisting of phase detector and data conversion modules housed in a custom, low-noise single PXIe mainframe four units (4U) high, the N5511A occupies minimal rack space. The system software included runs on an integrated PC controller using the Microsoft Windows 10 operating system.

More information is available online at www.keysight.com/find/PNTS and www.keysight.com/find/N5511A.

5G Test Solution

National Instruments has announced the mmWave Vector Signal Transceiver (VST) to optimize validation and production test of 5G mmWave RFIC components, including transceivers, power amplifiers, beamformers, and antennas.

With chipmakers racing to commercialize 5G mmWave technology, engineers face the daunting challenge of accelerating product schedules combined with new and often unsolved technical requirements.

NI mmWave test solutions address these challenges both in the R&D lab and the high-volume manufacturing environment by delivering lab-grade measurement quality in an architecture designed to scale to the specific needs of production test for mmWave chips with a unified software experience that simplifies measurement and automation.

The NI mmWave Vector Signal Transceiver (VST) complements NI’s current VST offering, extending coverage with 5 GHz – 21 GHz and 24 GHz – 44 GHz ranges for IF and mmWave testing, respectively. Using NI VSTs, engineers get fast, lab-grade, high-bandwidth signal generation and analysis at new test points along the signal chain of mmWave 5G semiconductor devices.

For more information, please visit www.ni.com.

 

Microcontroller

NXP Semiconductors LPC5500 Series Arm® Cortex®-M33 Microcontrollers are designed to accelerate low-cost secure Edge applications, delivering high levels of processing efficiency, security, and functionality. The LPC5500 Series offers dramatic power consumption improvements and advanced security features, including SRAM PUF based root of trust and provisioning, real time execution from encrypted images (internal flash), and asset protection with Arm TrustZone-M. In addition, the LPC5500 MCU Series provides a comprehensive offering and several scalability options with seven families, all of which benefit from 40 nm cost advantages, broad scalable packages and memory options, as well as a robust enablement including MCUXpresso Software and Tools ecosystem and low-cost development boards.

The LPC5500 MCU Series features pin, software, and peripheral compatibility across each family, with varying levels of functionality, resulting in a portfolio that maximizes re-use, reducing development costs, and improving time to market.

Applications include Diagnostic Equipment, Consumer Electronics, Industrial IoT and Secure applications.

Find more information at http://www.nxp.com.

 

Miniature Piezo Components for Medical Device Manufacturing

In 1880, brothers and colleagues Jacques and Pierre Curie discovered that putting pressure on certain materials created electricity. Taken from the Greek word for “squeeze” (piezein), piezoelectricity was born. Commonly known as the “piezo effect,” it also occurs when an electrical field is applied and changes the dimensions of materials. More than a hundred years later, PI Ceramic (a division of PI Physik Instrumente) specializes in the field of piezo ceramic components, including its newest line of mini transducers.

One of the latest applications of miniature piezo tube transducers can be found in scanning fiber / scanning catheter endoscopes (SFE). These miniature endoscopes provide laser-based high-resolution video to enable minimally invasive procedures. Miniaturized piezo plates are used to drive pumps for micro-dosing and nano-dosing of drugs. Ultrasonic piezo transducers can be used for bubble detection in dialysis or blood transfusion applications and for atomization of medication (aerosol generation), to name a few.

Piezo ceramic actuators and transducers achieve high dynamics with frequencies up to millions of Hertz and excellent reliability. Various shapes and very small dimensions are possible to create precision motion based on crystalline solid-state effects. For example, the new ultra-small piezo tube transducers come in two standard sizes: 0.2/0.5 mm ID/OD (inner/outer diameter) with 4 mm length, and 0.9/1.5 mm ID/OD with 15 mm length.

Custom geometries (length, diameter) and custom materials are available, in addition to the large variety of standard piezo tubes and tubular stack transducers offered by PI. Users can choose from electrodes applied in thick-film and thin film technology. Other options include multi-segmented electrodes for multi-axis scanning operation and modified response behavior as well as wrap-around contacts for easy integration into a mechanical assembly.

Find more information at www.Pi-USA.us.

Programmable DC Loads

SIGLENT Technologies has introduced the SDL1000X and SDL1000X-E series of programmable electronic dc loads, which are designed for battery, solar cell, and power supply testing. The SDL1020X/X-E models offer an input range of 150 V/30 A with 200 W total power dissipation, while the SDL1030X/X-E’s have an input range of 150 V/30 A up-to 300 W. The X type provide a measurement resolution of 0.1 mV/0.1 mA, whereas the economical X-E type offers 1 mV/1 mA.

A 4-wire sense compensation mode is also implemented to remove any potential error due to a voltage drop in the connection wires. These dc loads support all the common modes of operation: CC, CV, CR and CP.

One of the most important features of this new e-load series is its high-speed response performance. In dynamic test mode, the highest frequency of periodical switching between two user-defined levels (Level A and Level B) can achieve 25 kHz. The adjustable slew rate can be set by the user up to a value of 2.5 A/us.

All models come standard with a 3.5-inch TFT-LCD display and user-friendly interface. As part of this functionality, operators can use the Program function (maximum 50 groups) and List function (maximum 100 steps) to create complex discharge profiles, which can be useful in battery charging circuitry design.  The SDL1000X/X-E series is equipped with additional features that include an LED-test mode (CR-LED) designed specifically for LED driver testing. This mode can emulate LED’s actual characteristics such as single continuity. Furthermore, the instruments have a voltage threshold function, trend chart function, and voltage Rise/Fall speed test.

Find more information at www.siglentamerica.com/dc-electronic-load/sdl1000x/.

 

New 16-Bit Arbitrary Waveform Generator (AWG) with 8 Channels Per Card

Spectrum Instrumentation has used its modular design philosophy to create a unique solution for customers wanting multi-channel AWGs. Having 8 AWG channels on a single PCIe-card only 168 mm in length offers great new opportunities for very compact and affordable test systems. The addition of the two new 8-channel-cards to Spectrum's latest "65" series of PCIe Arbitrary waveform generators means that, using Spectrum's Star-Hub, up to 80 channels can be fully synchronized in a single PC. All cards of the "65" series offer a huge on-board memory of 512 MSamples to store and replay lots of waveforms. Using the PCIe-x4 platform, these AWGs provide a data transfer speed which is 5 to 10 times higher than in other solutions, offering 700 MByte/s of FIFO streaming speed. This is ideal for automated testing when customers need to replay lots of different test signals over many channels to accurately recreate real world test conditions. Applications include component testing, automotive, robotics, aerospace, medical and industrial ultrasound, LIDAR, radar and sonar.

Offering up to 8 channels per card, the cost per channel is cut dramatically. The system cost of Spectrum card-based AWG solutions are also significantly less expensive than dedicated, self-contained AWG solutions that can be several times more expensive, even when allowing for the cost of a PC to house the Spectrum cards.

To even better simulate and stimulate real-world conditions for testing, the cards have more memory on board than other AWG cards. The 512 MSamples of memory enables the cards to store and replay many more, high quality, precision waveforms for faster automated testing applications that use signals in the frequency range from DC to 60 MHz.

More information about Spectrum can be found at www.spectrum-instrumentation.com.

 

New Mixed Domain Oscilloscope (MDO) and Mixed Signal Oscilloscope (MSO)

Tektronix, Inc. has introduced two new products with the launch of the 3 Series Mixed Domain Oscilloscope (MDO) and 4 Series Mixed Signal Oscilloscope (MSO), delivering the most powerful, versatile and easy-to-use oscilloscopes in the market.

Built on the user experience first introduced in the 5 and 6 Series MSOs, the new 3 Series MDO and 4 Series MSO feature a highly intuitive touchscreen user interface, the largest and highest resolution display in their class and a modern industrial design. Now with more options across an array of demanding applications, Tektronix' state-of-the-art product portfolio delivers advanced measurement and analysis capabilities and provides a comprehensive range of performance options for engineers.

The new 4 Series MSO features a 13.3-in. display with 1920 x 1080 HD resolution, the largest and highest resolution in its class. It offers bandwidths up to 1.5 GHz and uses 12-bit ADCs for the highest vertical resolution in its class as well. It is the first scope in this class to offer six input channels and with innovative FlexChannel™ technology, any input channel can be converted from an analog to eight digital channels simply by connecting a logic probe.

To meet a diverse range of application requirements, the 4 Series MSO is available with bandwidths starting at 200 MHz and is well supported with options including serial decode and analysis, an arbitrary/function generator and a DVM/frequency counter. The new Spectrum View feature offers time correlated frequency domain analysis with independent spectrum controls. A power analysis package is available to automate AC line, switching device, ripple and sequencing measurements.

Bandwidth and options are all field upgradeable. All models deliver a 6.25 GS/s sample rate on all analog and digital channels. Standard record length is 31.25 Mpoints with an option for 62.5 Mpoints.

The 3 Series MDO is more than an oscilloscope and can cover a wide range of debugging and validation tasks. It offers a built-in spectrum analyzer up to 3 GHz, with a separate RF input and specifications comparable to a standalone analyzer. This enables engineers to quickly debug wireless components in their designs or quickly track down sources of unwanted EMI emissions without having to use another instrument. Sixteen digital input channels are available for mixed signal analysis.

The new 3 Series MDO is available in bandwidths starting at 100 MHz and extending to 1 GHz. Models are available with 2.5 GS/s or 5 GS/s sample rates on all analog and up to 8.25 GS/s on digital channels with 121.2 ps timing resolution.

More information is available at www.tek.com.

 

Mesh Networking Starter Kit

Silicon Labs EFR32xG21 2.4GHz Mesh Networking Starter Kit supports Bluetooth, Zigbee, Thread and Multiprotocol Zigbee/Bluetooth software stacks. The Starter Kit contains a BRD4180A Radio Board that is a complete reference design for the EFR32xG21 Wireless SoC, with matching network and a PCB antenna for 20 dBm output power in the 2.4 GHz band.

The EFR32xG21 Wireless Start Kit contains an on-board J-Link debugger with a Packet Trace Interface and a Virtual COM port. The Starter Kit enables application development and debugging of the attached radio board as well as external hardware. The kit supports Simplicity Studio™, Energy Profiler, and Network Analyzer software that provides one-click access to design tools, documentation, software and support resources for Wireless Modules and SoCs using Bluetooth.

The mainboard also contains sensors and peripherals for easy demonstration of some of the EFR32's many capabilities. The EFR32xG21 Wireless Start Kit uses advanced tools including energy profiling and network analysis to optimize your wireless systems.

The Starter Kit Includes:

  • BRD4180A Radio Board

  • EFR32xG21 Wireless Gecko Wireless SoC with 1024 kB Flash and 96 kB RAM (EFR32MG21A020F1024IM32)

  • Inverted-F PCB antenna (2.4 GHz band)

  • Wireless STK Mainboard

  • Packet Trace Interface

  • Virtual COM port

  • External device debugging

  • Ethernet and USB connectivity

  • Low power 128x128 pixel Memory LCDTFT

  • Software

  • Simplicity Studio™

  • Energy Profiler

  • Network Analyzer.

Find more information at www.silabs.com.

 

Ultrafast Fiber Laser

TOPTICA has introduced the new FemtoFiber ultra 920, designed to meet the needs of users for a reliable, compact and cost-effective solution. The laser features a pulse duration <100 fs with a center wavelength of 920 nm and 1.5 Watt of average power (18.5 nJ at 80 MHz repetition rate). The unmatched temporal and spatial beam characteristics of the laser are fully tailored for deep-tissue nonlinear microscopy, providing excellent optical contrast and signal-to-noise.

The FemtoFiber smart laser systems are turnkey fiber-based picosecond and femtosecond mode-locked fiber lasers. The PicoFYb and FemtoFYb are oscillators ideally suited for seeding industrial laser systems. The FemtoFErb 1560 is the most compact and cost-effective source for

terahertz generation. The FemtoFiber smart 780 is the ideal choice for integration into microscopes, but also for two-photon generation or seeding of titanium-sapphire

 lasers.

For more information, visit www.toptica.com.