New Products

Please send all “New Products” information to:
Robert M. Goldberg
1360 Clifton Ave.
PMB 336
Clifton, NJ 07012 USA


5 GHz Oscilloscope

Pico Technology has introduced the PicoScope 9404 SXRTO (Sampler eXtended Real Time Oscilloscope). The 9404 features four 5 GHz 12-bit channels, each supported by real-time sampling to 500 MS/s per channel and up to 1 TS/s (1 ps) equivalent-time sampling.  Both the voltage and timing resolution specifications are characteristics of the highest performance broadband oscilloscopes.


The wide-band inputs, and fine timing and voltage resolutions, display and accurately measure transitions as fast as 70 ps, clock performance and eye diagram analysis of gigabit signals. Also, you can measure less than 2 ps RMS trigger jitter and 5 GHz internal trigger supports margin analysis and characterization of today’s high-speed serial data systems.  Real time broadband sampling can support simultaneous display of baseband modulation, carrier envelope and envelope track control signals around amplify, route and transmit paths, including major wireless communication frequency bands such as 900 MHz and 2.4 GHz.


Nearly all RTO’s use random Equivalent Time Sampling (ETS) to extend sampling density when repetitive signals are available.  Pico’s SXRTO architecture samples at a more cost-effective lower rate of 500 MS/s and instead develops the ETS technique to achieve a sample rate multiplication of x 2000 to 1 TS/s. Many high bandwidth signals are repetitive, so the expensive high sampling rate is not needed.


In contrast to “Sampling Oscilloscopes,” the ETS technique supports trigger and pre-trigger capture and the familiarity, convenience and ease of real-time oscilloscope operation.  Pico’s SXRTO technology seamlessly transitions to single event waveform capture at sampling rates at and below 500 MS/s into capture memory of 250,000 samples (single channel); particularly valuable for the capture of slower system signals and modulation envelopes for example.


This USB controlled instrument is supplied with PicoSample 4 software. The touch compatible GUI supports set up of the instrument and presents waveforms, measurements and statistics on the user preferred size and format of display.  This includes full support for Hi Resolution monitors and projection, for example 4k.  Up to four independent zoomed trace views can be used to examine the waveform details.

A wide range of automated and user-configurable signal integrity measurements, mathematics, statistical views and limits test facilities are included for validation and trending of pulse and timing performance, jitter, RZ & NRZ eye diagrams. Industry-standard communications mask tests such as PCIe, GB Ethernet and Serial ATA are included as standard.


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New Time Domain and Real Time Scan Capabilities in EMI Receiver

Keysight Technologies, Inc. has announced the addition of Time Domain Scan (TDS) and Real Time Scan (RTS) capabilities to the Keysight N9048B PXE Electromagnetic Interference (EMI) receiver and enables real time measurements and diagnostics for faster electromagnetic compliance (EMC) certification.

EMC testing requires detailed and exacting methodologies to ensure that all emissions are accurately measured. Long test times impact test facility availability and reduce the number of devices that can be certified. It's also easy to miss intermittent disturbance signals with conventional scan mode since long dwell time is required at each frequency. Keysight's new TDS and RTS capabilities in the N9048B PXE EMI receiver enable independent compliance test laboratories, as well as in-house self-certification labs, to shorten overall test time and easily perform gapless signal capture and analysis, certifying that a product meets regulatory compliance standards.

The N9048B PXE EMI receiver, with three frequency ranges up to 26.5 GHz, delivers:

  • Leading sensitivity performance which allows detection of small signals close to the noise level, common in radiated emissions measurements.
  • Full compliance with CISPR 16-1-1:2015 and MIL-STD-461G (2015), ensuring devices comply with worldwide and regional standards.
  • TDS and accelerated TDS capabilities to meet dwell measurement requirements while reducing receiver scan and test time from multiple hours to seconds.
  • Full signal visibility, where the RTS provides gapless signal capture and analysis in up to 350 MHz bandwidth and simultaneously displays the frequency domain, time domain and spectrogram, with three EMC detectors.

More information is available at


Optical Spectrum Analyzer Improves Time-to-market of High-speed Optical Devices

Anritsu Company introduces the Optical Spectrum Analyzer (OSA) MS9740B that combines high-end measurement-sensitivity performance, expanded functionality, compact size, and high-speed measurement capability. With the MS9740B, design and manufacturing engineers can accurately verify and improve time-to-market of 100G/400G optical modules designed into 5G and Cloud communications systems.

To improve measurement speed by 50%, Anritsu enhanced the optical receiver bandwidth settings of the MS9740B. This design approach significantly improves throughput while maintaining high performance. The benchtop OSA has wide dynamic range of >70 dB and maximum measurement processing time of 0.35s (sweeping 30-nm wavelength). Optical sensitivity is as low as –90 dBm. Accurate side mode suppression ratio (SMSR) measurements can be made at 45 dB or more, helping engineers have confidence in their designs.

The MS9740B is designed for high-throughput production environments. It supports multimode fiber input and is ideal for manufacturing and evaluating 850-nm band VCSEL modules. Its wide wavelength range of 600 nm to 1750 nm, however, makes the OSA well suited for evaluating all active optical devices.

Verifying high-speed optical devices is simplified with the MS9740B. All measurement modes can be easily accessed via intuitive menu screens. Further simplifying device verification, the OSA supports all-at-once measurements of key evaluation items, such as optical center wavelength, level, OSNR, and spectrum line width, with results displayed on a single screen.

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Integrated Biosensor Module for Mobile Devices

Designers now have an easier way to deliver both photoplethysmogram (PPG) and electrocardiogram (ECG) measurements for health monitoring from a mobile, battery-powered device. The new MAX86150 from Maxim Integrated Products, Inc. is a first-of-a kind biosensor module, comprised of internal LEDs, photodetectors and an ECG analog front-end (AFE) to provide highly accurate, FDA-certifiable PPG and ECG performance in compact, power-saving designs, including mobile phones, laptops, tablets and smart speakers.

Delivering synchronized PPG and ECG measurements has been challenging because designers have had to utilize two separate biosensors that together consume more board space and power than a mobile device can typically afford. In addition, achieving high accuracy in the measurements has also been challenging, particularly in cases where sensor sensitivity might be impacted by low perfusion levels or dry skin. The MAX86150 overcomes these challenges, sampling both PPG and ECG simultaneously to provide the highest sensitivity of pulse transit time. To reduce battery drain, the module can be shut down through software with near-zero standby current, allowing the power rails to remain powered at all times. The MAX86150 is available in a 3.3 mm x 6.6 mm x 1.3 mm, 22-pin optical module.


  • Long Battery Life: minimizes battery drain with ultra-low shutdown current of 0.7 μA typical. Power consumption less than the closest comparable device further extends battery life compared to other solutions.
  • Ease of Deployment: its dry electrode operation eliminates the need for gels, fluids and sticky or wet pads on other parts of the body to obtain accurate readings.
  • Small Form Factor: the same size as a stand-alone ECG sensor, integrating an ECG sensor with an optical PPG sensor saves space and provides much more functionality without requiring a third electrode (which other solutions require).

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New Signal and Spectrum Analyzer Families Perform Up to 44 GHz.

The R&S FSV3000 is designed to help users set up complex measurements in the simplest and fastest way possible. It provides up to 200 MHz analysis bandwidth— enough to capture and analyze two 5G NR carriers at once.

The R&S FSVA3000, with up to 400 MHz analysis bandwidth, a high dynamic range and an outstanding phase noise of –120 dBc/Hz, delivers performance that was, until recently, reserved for high-end instruments. It enables users to perform highly demanding measurement applications such as linearizing power amplifiers, capturing short events and characterizing frequency agile signals.

Both the R&S FSV3000 and R&S FSVA3000 can measure EVM values better than 1% for a 100 MHz signal at 28 GHz. Together with the coverage of the 5G NR frequency bands up to 44 GHz, this makes the analyzers ideal for analyzing 5G NR signals.

The R&S FSV3000 and the R&S FSVA3000 spectrum analyzers simplify troubleshooting rare events and setting up complex measurements. With the event-based action GUI, whenever a predetermined event occurs the corresponding action, such as saving a screenshot or I/Q data, is performed.

Auto measurements shorten the setup time of the instrument itself. At the press of a button, parameters such as center frequency, span and amplitude reference are automatically set based on the applied signal, and in the case of a pulse signal, the gate sweep parameters are set.

In scenarios with automated production lines with complex measurements, external computers can take over the control of the instruments via SCPI commands.

The R&S FSV3000 and R&S FSVA3000 are designed for high-speed performance in automated test systems. Both perfectly interact with cloud-based processing. The optional 10 Gbit/s LAN interface enables I/Q data transfer toward the network end even at high sample rates, which is required for wideband signal analysis such as for 5G.

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Compact Heavy-Duty Stackable Acoustic Test Chamber

Alfamation announces the ELC-6, an anechoic acoustic test chamber that is one third of the size of other solutions. The ELC-6 is used to isolate the device under test (DUT) from the external environment to achieve exceptionally accurate testing in high-volume production scenarios. The test chamber can internally reproduce the far field condition.      

The key benefit of the ELC-6 compared to other similar test chambers is its considerably reduced size—around one third of the typical physical size—while providing comparable acoustic shielding performance and a high sound insertion loss of typically 40 dB at 1 KHz. Its compact dimensions (230 x 280 x130 mm) create new precious space on the factory floor and, importantly, enable test chambers to be stacked on top of each other. Depending on the product size and application, the chamber can usually host more than one DUT. 1 The ELC-6 chamber is designed to test any audio speaker in the 20 Hz to 20 kHz range.

The test chamber can be supplied and used in manual, semi-automatic and fully-automatic configurations. The manual mode is the simplest, where an operator opens and closes the door as required. In the semi-automatic mode, the chamber doors are locked and unlocked automatically, while the fully-automatic mode enables the ELC-6's integration into an automated production line with robotic loading and unloading of DUTs.

The new ELC-6 is heavy-duty, constructed on a solid cast aluminum base with sound absorbers, thus enabling pneumatically-assisted loading and unloading. It includes integrated pass/fail LEDs, and a customizable connector panel allowing DUT feed and measurement signals to be transmitted in and out, and of course provides connections for microphones.

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Arbitrary Function Generator

The Tektronix AFG31000 series with InstaView technology is a high-performance AFG with built-in waveform generation applications, patented real-time wave monitoring, and a modern user interface. With the AFG31000, you can see your measurements quickly and accurately— without the need for an additional oscilloscope or probes.

Patented InstaView technology enables users to view the real waveform at the device under test (DUT) directly on the AFG without the need for an oscilloscope, probes, or additional equipment, saving test time and eliminating the risk of unmatched impedance in your test results.

Users can generate long, precise waveforms in continuous mode with lengths up to 16 Mpts per channel right out-of-the-box. Variable sampling clock technology guarantees you will never lose any waveform data.

With optional upgrades you can get:

  • Memory extension to 128 Mpts per channel (option MEM).
  • Sequence/triggered/gated modes (option SEQ) with up to 25 entries and controls for: branching, repeat, wait, jump, go-to, external trigger in, manual trigger, timed trigger, and SCPI command, for building long waveforms with complex and flexible timing.

The built-in arb editing tool, ArbBuilder, includes all operations to create, edit and transfer an ARB waveform, eliminating the need to connect or transfer files to a PC. The amplitude and offset data are stored in the waveform, removing the need to adjust the settings after loading a normalized arb.

The 9-inch touchscreen works just like a smart device so you can pinch, zoom and scroll to easily locate settings and parameters on the simplified menu and find shortcuts to frequently used settings.

If you need more than two channels of waveforms to stimulate your device under test (DUT), multi-sync enables you to quickly sync up two or more units.

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Battery Cell Surge Tester

Designed for testing the insulation quality between the positive and negative plates of a lead-acid battery cell, the Chroma 19311 applies a high voltage surge/impulse before the electrolyte injection process effectively decreasing defective rates in production. Chroma has given the surge tester an output voltage that can reach up to 6 kV, has four terminal measurement, and a sampling rate of 200 MHz.

The Chroma 19311 is offered in either a single channel (19311) or multi-channel (19311-10) unit. The 19311-10 has 10 channels which can test up to 9 battery cells within a single unit. Testing up to 24 cells in a sequence can be achieved by connecting the 19311 with an external scanner (A190362).

The speed of the multi-cell scanning test is extremely efficient, saving test time. By using a resonant waveform to identify insulation quality deficiencies, the 19311 can increase the capacity of good units in the production line.

The 19311’s surge test applies a non-destructive low energy impulse voltage to the lead-acid battery cell. During the surge test, the lead-acid battery cell resonates with the internal inductor in the 19311. The tester then determines if the insulation is defective or not by analyzing the resonant waveform or comparing the test waveform with a golden sample waveform. Testing the lead-acid battery cell with a high voltage surge before the electrolyte injection checks the insulation distance and the insulation quality between the positive and negative plates, determines the integrity of the separator between the positive and negative plates, and identifies if the positive and negative plates are shorted.

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X-Ray Inspection System for Semiconductor Industry

YXLON International is launching a brand-new range of X-ray inspection systems dedicated to the Semiconductor industry. These systems offer advanced automated 2D and 3D inspection of bumps and filled vias to locate, identify and measure failures, including non-wetted bumps, voiding and misalignments to the highest standard. In terms of resolution these systems are among the best on the worldwide market.

The FF70 CL and FF65 CL series are fully automated analysis systems offering ultra-high resolution and magnification for the smallest semiconductor defect detection. The brand-new range of inspection systems provides automated analysis of TSVs, C4 bumps, 3D packages and MEMS at wafer, strip or component level with maximum throughput. Finally, the FF65 IL with its integrated loader is designed to meet the needs of volume manufacturing while maintaining leading features and benefits. They were developed under collaboration with Nagoya Electric Works.

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3D Scanning Laser Tracker

Hexagon’s Manufacturing Intelligence division introduces the Leica Absolute Tracker ATS600. This new product introduces a new concept in metrology-grade laser trackers, with targetless 3D scanning possible for the first time, directly from the laser tracker. The ATS600 can scan a surface with metrological accuracy from a distance up to 60 meters with no need for targets, sprays, reflectors or probes.

Following in the footsteps of the Leica Absolute Scanner LAS-XL that was released in 2017, the ATS600 delivers as much accuracy as is needed by targeted metrology applications, with its focus more on measurement usability and processing speed. Previously difficult to reach areas are simply measured without even the need for tracker repositioning, while surfaces that would previously have taken hours to manually scan can now be digitized in minutes.

The system works by identifying a scan area within its field of view and then creating a sequentially measured grid of data points that define that surface, with accuracy to within as little as 300 microns. Measurement point density is fully customizable, so that users can choose the ideal balance between detail and process speed for their specific application. The Leica Absolute Tracker ATS600 is unique in delivering this functionality at metrology-grade accuracy and alongside easy integration within established metrology workflows— the ATS600 is compatible with all major metrology software platforms as has been designed to sit comfortably within a wider metrology toolkit.

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Miniature Triaxial ICP Accelerometers with TEDS

PCB Piezotronics has released its smallest, 0.47 inch (11.8 mm), ground isolated, miniature triaxial cube accelerometers with TEDS (Transducer Electronic Data Sheet).

Models J356A43 / 44 / 45 join the family of miniature triaxial ICP accelerometers with TEDS that are ideal for modal and structural analysis, electric automotive NVH, and package testing.  Available in three ranges, 50 g / 100 g / 500 g, these accelerometers greatly reduce signal noise from electrical interference, or poor grounding, as the sensors are electrically isolated from the mounting surface.  These accelerometers achieve ground isolation with use of a very thin layer of nonconductive glass-filled epoxy and a three-sided titanium shell, achieving excellent mechanical coupling without significantly increased weight.

Highlights include:

  • Ground isolation
  • Wide frequency bandwidth
  • Hermetically-sealed titanium housing

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Compact XYZ Nanopositioning System

Based on a parallel-kinematic design, with only one lightweight moving platform for all 3 axes, PI’s P-616 positioning system is available with high precision and dynamics in a compact package. Also known as the NanoCube®, PI claims it is the smallest and lightest system with capacitive feedback delivering a travel range of 100 µm in 3 degrees of freedom.

The piezo scanner can be combined with compact motorized micro-positioning stages, such as PI’s L-505 miniature stage, to achieve long travel ranges up to 1 inch in a very small package. 

The P-616 is operated with PI’s E-727 digital servo piezo controller, which offers the advantage of higher linearity, faster settling and scanning speed, and easy access to all motion parameters, compared to conventional analog piezo controllers. An all-inclusive software package is included: drivers for LabVIEW, dynamic libraries for Windows and Linux, MATLAB. Interfaces consist of USB, SPI, RS-232, and analog. Supported functions include Wave generator, data recorder, auto zero, and trigger I/O.

The XYZ piezo stage is driven by ceramic-encapsulated preloaded and flexure motion-amplified PICMA® piezo actuators that provide better performance and reliability than conventionally insulated piezo actuators.

Find more information at  You can also watch a video of how quickly the NanoCube performs fiber alignment at