This website is an immediate source for specific material within the IEEE Instrumentation & Measurement Magazine. Its goal is provide you with a format to review the current contents of the latest issue and to review previous issues. Its purpose is not to replace the paper edition of the magazine but to allow readers quick access to the latest material.
The IEEE Instrumentation and Measurement Magazine has the goal of providing readable introductions and overviews of methodologies, technologies and applications in the field of Instrumentation and Measurement to a wide engineering audience.
To such aim many special issues are dedicated to specific hot and challenging topics in the Instrumentation and Measurement framework.
If you would like to write an article or tutorial for the magazine, please review the Magazine’s author guidelines and submit the prepared to the Peer Track submission system.
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IEEE Instrumentation & Measurement Magazine Archive
Click the issue date to download selected columns, summaries of columns and feature articles in the magazine.
December 2010: Measurement Technologies |
October 2010: Ongoing Education |
August 2010: AUTOTESTCON 2009 Technical Highlights |
June 2010: Nanotechnology |
April 2010: Sensors |
December 2007: Processing within Instrumentation |